MACS member Hui Xiao wins the ASME Dynamic Systems and Control Division Best Student Paper on Mechatronics Award

MACS member Hui Xiao wins the ASME Dynamic Systems and Control Division Best Student Paper on Mechatronics Award

The ASME Dynamic Systems and Control Division (DSCD) Best Student Paper on Mechatronics award is given to the best original paper in the area of mechatronics written primarily by a student author and presented at a DSCD-sponsored event. The paper must have been presented and published in one of the following conferences: IEEE/ASME International Conference on Advanced Intelligent Mechatronics (AIM), American Control Conference (ACC), ASME Dynamic Systems and Control Conference (DSCC). The winning student author receives a $500 prize and a certificate honoring his or her achievement.

Hui’s paper, titled “Multi-band beyond-Nyquist Disturbance Rejection on a Galvanometer Scanner System,” won this year’s Best Student Paper on Mechatronics award. Selective laser sintering (SLS) is an additive manufacturing process that uses a laser as the power source to sinter powder materials. An SLS machine is often subject to various disturbances that prohibit it from maintaining good product quality. In order to reject such disturbances by feedback-based control schemes, the sampling rate of the output needs to be fast enough to cover all major frequency components of the disturbance. However, if using cameras as the sensor for inspecting the laser-material interaction zone, the feedback sampling rate will be severely limited; major portions of disturbance will exceed the sampler’s Nyquist frequency. This paper introduces a multi-rate control scheme to fully reject narrow-band beyond-Nyquist disturbances in the selective laser sintering process. The proposed algorithm consists of a special bandpass filter with a tailored frequency response, and a model-based predictor that reconstructs signals from limited sensor data. Verication of the algorithm is conducted by both simulation and experiments on a galvanometer scanner system testbed.
Congratulations Hui!